Dr. Qianmei Feng·University of Houston, Houston, TX·Integrated Modeling and Optimization of Quality and Reliability for Advanced and Evolving Technologies·2010年7月19日星期一上午·北510 2010.07.14

【Time】 11:00am-12:00PM,July 19, 2010 (Monday)

【Venue】Room 510, Shunde Building

【Speaker】Dr. Qianmei Feng, Ph.D.,Assistant Professor,Department of Industrial Engineering,University of Houston, Houston, TX

【Host】 Dr. Kaibo Wang

【Title】Integrated Modeling and Optimization of Quality and Reliability for Advanced and Evolving Technologies


【Abstract】 The objective of this research to develop integrated quality and reliability models and analysis tools that provide fundamental insights for the successful development and commercialization of evolving technologies, such as Micro-Electro-Mechanical Systems (MEMS) and biomedical implant devices. For many new and evolving technologies, their continued successful development depends on the concurrent modeling and optimization of process variability and product life, which are inherently linked for many of these technologies. The first research effort is to develop an integrated quantitative methodology to jointly optimize system quality and reliability. Based on this integrated framework, probabilistic models will be investigated for predicting reliability of devices that experience multiple failure processes due to simultaneous exposure to degradation and shock loads. Competing risk models with dependent failure processes will be developed and extended. In addition, reliability models will be developed for complex systems with multiple independent or dependent components. Multiple user objectives (e.g., quality, reliability, yield, cost, etc.) will be simultaneously considered by the formulation and solution of multi-objective optimization problems. Finally, the developed models will be validated for MEMS and biomedical implant devices through collaborations with industrial and government partners. A solid multidisciplinary scientific foundation will be built to combine methodologies in quality, reliability, statistics and operations research. In addition, the success of this research will offer fundamental insights that can be transformed to many newer design and manufacturing problems, such as nano-technology that also has unique manufacturing challenges. The integrated methodology can provide timely and effective tools for decision-makers in manufacturing to economically optimize operational decisions for improving reliability, quality and productivity.

The details of several sponsored projects will be presented in this seminar including an NSF project and a project supported by the Texas Advanced Research Program.


【Bio Sketch】Qianmei Feng is an Assistant Professor, and the Brij and Sunita Agrawal Faculty Fellow in the Department of Industrial Engineering at the University of Houston, Houston, TX. She received the Ph.D. degree in Industrial Engineering from the University of Washington, Seattle, WA in 2005.  She received her Dual Bachelor degrees in Mechanical Engineering and Industrial Engineering from Tsinghua University, Beijing, China (1998) with Summa Cum Laude, and her Master’s degree in Management Science from Tsinghua University (2000).  She has dedicated her research in the area of system modeling, analysis and optimization in quality and reliability engineering, with applications in evolving technologies (e.g., MEMS, biomedical implant devices), homeland security, and healthcare. She has had a number of research accomplishments with more than 30 publications in refereed journals and conferences within the last five years, such as IIE Transactions, IEEE Transactions on Reliability, Reliability Engineering and System Safety, Computers and Industrial Engineering, Journal of Operational Research Society, and Risk Analysis. Her research has been supported by the National Science Foundation (NSF), Department of Homeland Security (DHS), Texas Department of Transportation (TxDOT), and Texas Higher Education Coordinating Board (THECB). Currently, she serves as the president for the Division of Quality Control & Reliability Engineering in the Institute of Industrial Engineers (IIE). She is also a member of INFORMS, ASQ, and Alpha Pi Mu.


Looking forward to your participation.


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