【Title】Data Analytics in Semiconductor Manufacturing Process
【Speaker】Dr. Young-Seon Jeong, Assistant Professor, Department of Industrial Engineering, Chonnam National University, South Korea
【Host】Dr.Kaibo Wang
【Time】January 8th, 2018 (Monday)  14:00-15:00
【Location】 Room N412, Shunde Building

【Abstract】The semiconductor industry relies on informatics tools to extract useful information such as process conditions and yield rate predictions from multiple data sources. In semiconductor production processes, it is critical to locate defective ICs chips on the wafer, which is an elementary unit in semiconductor manufacturing. Wafer maps are usually employed to investigate spatial dependence of defective chips across wafers. Such defect patterns hold important information, which can assist process engineers in understanding the ongoing manufacturing processes. This talk will discuss an overview of several research topics in semiconductor process, with a particular focusing on the generic data-driven approaches to identify specific patterns of defective chips and monitor out-of-control process. We use diverse types of wafer maps including simulation and real-life data to demonstrate the features of different models.

 【Short Bio】Young-Seon Jeong is an Assistant Professor in the Department of Industrial Engineering at Chonnam National University, Gwangju, South Korea.  He obtained his Ph.D. degree in Department of Industrial and Systems Engineering from Rutgers University, New Jersey, USA. His research interests include statistical decision-making model for monitoring of process control systems in semiconductor manufacturing, SPC for functional data, and intelligent transportation systems. He is a member of INFORMS.
 
All interested are welcome!