[Time] 14:00-15:00, April 08th, 2019, Monday

[Venue] Room N412, Shunde building

[Speaker] Dr. David W. Coit, Department of Industrial & Systems Engineering, Rutgers University, Piscataway, NJ, USA

[Host] Dr. Yanfu Li

[Title] Reliability Modeling and Optimization for Systems of Degrading Components

[Abstract] New system reliability models and analysis tools have been developed for different applications for systems of degrading components. System reliability analyses and maintenance optimization, involving multiple failure processes, are challenging research topics, particularly when the failure processes, such as degradation processes and random shocks, are competing and dependent. Traditional system reliability models are generally not applicable when there are multiple dependent degradation paths, yet many systems behave this way, and better models are needed, particularly if the components are individually repairable. In this talk, we present the first fundamental models to analyze the reliability of these systems, as well as several important extensions, including current work on clusters of components, repairable systems reliability and dynamic maintenance planning. Based on these new reliability models, different maintenance policies are derived to provide cost effective maintenance plans.

[Bio] David W. Coit is a Professor in the Department of Industrial & Systems Engineering at Rutgers University, Piscataway, NJ, USA. His current teaching and research involves system reliability modeling and optimization, and energy systems optimization. His research has been funded by National Science Foundation (NSF), U.S. Army, U.S. Navy, industry, and power utilities. He has over 110 published journal papers and over 90 peer-reviewed conference papers. He has been awarded several NSF grants, including a CAREER grant from NSF to develop new reliability optimization algorithms considering uncertainty. He was also the recipient of the P. K. McElroy award, Alain O. Plait award and Willian A. J. Golomski award for best papers and tutorials at the Reliability and Maintainability Symposium (RAMS). He also has over ten years of experience working for IIT Research Institute (IITRI), Rome NY. He received a BS degree in mechanical engineering from Cornell University, an MBA from Rensselaer Polytechnic Institute, and MS and PhD in industrial engineering from the University of Pittsburgh. He is a Department Editor for IISE Transactions and an Associate Editor for Journal of Risk and Reliability, and he is a member of IIE and INFORMS.

All interested are welcome!